Shot noise in graphene
Carlo Beenakker
Instituut-Lorentz, Leiden University
Thu, Sep. 18th 2008, 14:00
Salle du Conseil, RdC, Bât. 100, IPN, Orsay
Recent measurements [1,2] of the low-temperature electrical noise in graphene have found a shot noise power which is three times smaller than the value expected for a Poisson process of independent current pulses. Two theoretical explanations are discussed, the first [3] in terms of the shot noise of evanescent modes, the second in terms of the shot noise of fractal diffusion [4]. \\ \par \noindent [1] L. DiCarlo et al. Phys. Rev. Lett. 100, 156801 (2008). \par \noindent [2] R. Danneau et al. Phys. Rev. Lett. 100, 196802 (2008). \par \noindent [3] J. Tworzydlo et al. Phys. Rev. Lett. 96, 246802 (2006). \par \noindent [4] C.W. Groth et al. Phys. Rev. Lett. 100, 176804 (2008).
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